Plenary Panel

Future Test Technology Needs

Tuesday, November 3
10:30 AM - 12:00 PM
Room: Woodrow Wilson A

Moderator: Bill Ross, Eagle Systems

  • Jay Romania, US Army, Competency Manager, ATS Division, RDAR-WSF-A, RDECOM ARDEC
  • Mike Malesich, US Navy, Head, ATE S/W Branch, Support Equipment Division, NAVAIR Lakehurst
  • Tony Conard, US Navy, TPS Acquisition Team Lead, NAVAIR Jacksonville
  • Chris Dosch, US Navy, Cyber Security Team Lead, NAVAIR PMA260
  • Wallace Daniel, US Marine Corps, ATS Technical Program Officer TMDE MDMC, Albany, GA
  • John Stabler, US Air Force, ACS Directorate, ATS Engineering Division, Warner Roberts, GA

A panel of automatic test system technical experts representing the multiple military services will offer vision and insights of future test technology needs across the broad spectrum of DoD electronics maintenance requirements.

Army Consolidation of ATS Enhances Weapon System Support Effectiveness

Wednesday, November 4
10:00 AM - 11:30 PM
Room: Baltimore 5

Moderator:  Mr. George Mitchell, PD TMDE

  • Mr Jay Romania, CM ATSD
  • COL Bruce McPeak, CASCOM
  • Mr. Paul Frantz, Tobyhanna Army Depot.


This Panel will discuss the current path to consolidate weapon system support.  Discussion will include schedule, tasks and efforts leading to and implementing an Army Standard ATE.  Panel members include all aspects of Army ATE/TPS requirements, development, implementation and support.

2015 Outlook of Modular Instrumentation in the T&M Industry

Wednesday, November 4
1:30 PM - 3:30 PM
Room: Baltimore 5

Moderator: Bob Helsel, Executive Director of the VXIbus Consortium, PXI Systems Alliance, LXI Consortium, and AXIe Consortium 

  • Mark Wetzel, Chair, PXISA Technical Committee; National Instruments
  • Tom Sarfi, President, VXIbus Consortium; VP Marketing and Business Devt., VTI Instruments Corp.
  • Christopher Cain, Chairman of the Board, AXIe Consortium, Technology Planning Manager, Keysight Technologies
  • Steve Schink, Chairman of the Board, LXI Consortium; Marketing Planner, Keysight Technologies


What is the status and outlook for VXI, PXI, LXI, and AXIe instrumentation? Has modular instrumentation become the defacto standard of automated test? In what applications? What does this mean for Mil/Aero applications in particular? Five industry experts will give brief presentations on these topics followed by an interactive panel discussion.   

Design for Testability

Wednesday, November 4
3:30 PM - 5:30 PM
Room: Baltimore 5

Moderator: Louis Y. Ungar, Advanced Test Engineering (A.T.E.) Solutions, Inc.

  • Dr. David R. Carey, Associate Professor of Electrical Engineering, Wilkes University. Previously with Tobyhanna Army Depot
  • Craig Stoldt, Test Engineering Manager, BAE Systems
  • Loofie Gutterman, President, Marvin Test Solutions, Inc.
  • Dr. Russell Shannon, IDATS Lead Systems Engineer, NAVAIR, US Navy, Lakehurst, NJ
  • Bill Eklow, Distinguished Engineer, Cisco Systems
  • Mike Ellis; Retired. Previously Northrop Grumman Corp., Test Automation, ATE Associates, Harris Corp. serving as AUTOTESTCON 2015 Technical Program Co Chairman


Many designs lack the necessary features to detect, isolate and easily repair failed circuits.  While DFT techniques, such as JTAG/IEEE-1149.1 boundary scan have assisted in board manufacturing test, their system level applications have been lagging.  We know that testability has to be implemented early in the design, but can test and design work together cost-effectively?  Whom do we ask to implement it?  How?  New techniques, such as the IEEE-1687 support hierarchical test, but can we get management backing to design testable systems?  Panelists and the Audience will offer pragmatic and useful recommendations.